K Shell X-Ray Fluorescence Yields for Elements in the Atomic Number Range 25 ≤ Z≤ 50 Excited by 59.54 Kev Gamma Rays

Abstract

K-shell fluorescence yields of low and medium Z elements
were determined using Si-PIN diode detector employing reflection
geometry set up. Target atoms were excited using 59.5 keV gamma rays
emerging from Am-241 source of strength 300 mCi. Background
radiation and multiple scattering effects were minimized by properly
shielding the detector. The elemental foils of uniform thickness and
99.9% purity were used in the present investigation. The emitted
fluorescent X-rays were detected using Si PIN diode detector. The
fluorescent spectra were recorded in an 8 K multi channel analyzer. The
data were carefully analyzed and total K-shell fluorescence yields were
calculated. The resulting yield values are compared with the available
experimental and theoretical values.