Sunil Kumar, Ajay Shankar, Nawal Kishore, Anita, Prem Singh. Influence of Thickness, Substrate and Wavelength on Laser Damage Threshold of SiO2Thin Films. J. Int. Acad. Phys. Sci. [Internet]. 2017 Dec. 15 [cited 2025 May 17];21(4):297-304. Available from: https://www.iaps.org.in/journal/index.php/journaliaps/article/view/501