SUNIL KUMAR; AJAY SHANKAR; NAWAL KISHORE; ANITA; PREM SINGH. Influence of Thickness, Substrate and Wavelength on Laser Damage Threshold of SiO2Thin Films. Journal of International Academy of Physical Sciences, [S. l.], v. 21, n. 4, p. 297–304, 2017. Disponível em: https://www.iaps.org.in/journal/index.php/journaliaps/article/view/501. Acesso em: 17 may. 2025.