Investigation of Microwave X-band Response on Bricks for Remote Sensing

Abstract

Microwave X-band spectrum is used to investigate the properties of reflected signal from bricks for remote sensing. The measurements are taken by varying angles of incidence from 30 degree to 60 degree in the intervals of 10 degree for both like polarizations (HHpol. & VV-pol.) by using an indigenously assembled bistatic scatterometer. The measured values of reflection coefficients are compared with the theoretical Fresnel reflection coefficients using Gaussian rough surface scattering models. The results indicate that the Fresnel reflection coefficients of the bricks for VV-polarization are well bound by the predictions for the smooth and Gaussian rough surface.